Advanced Materials and Processes (Elitestudiengang)
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2. Semester
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Mechanics and Physics of nanostructured materials [MPnanoMAT]
VORL; 2 SWS; Blockvorlesung; Zeit n.V., MAP PR; Einzeltermin am 12.6.2007, 9:00 - 13:00, CIP-Pool; Termine: Do., 26.04.2007, 9:00 - 13:00 Uhr; Do. 10.05.2007, 8:00 - 12:00 Uhr; Di. 15.05.2007, 09:00 - 13:00 Uhr; Do. 24.05.2007, 09:00 - 13:00 Uhr; Di. 05.06.2007, 09:00 - 13:00 Uhr; Ort: MAP Projektraum Di. 12.06.2007, 09:00 - 13:00 Uhr Ort: CIP Pool E-Technik R.0.124, Cauerstr. 7
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WF MAP-S-NM 2
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Xu, G.
Hartmaier, A.
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Kernfächer
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VORL; 2 SWS; ben. Schein; ECTS: 3; Fr, 10:30 - 12:00, 1.225
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Hartmaier, A.
Arlt, W.
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VORL; 2 SWS; ben. Schein; ECTS: 3; Di, 14:15 - 15:45, 1.225
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Wasserscheid, P.
Arlt, W.
Peukert, W.
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Nanoscale Surface Characterization and Structures [SurfChar]
VORL; 2 SWS; ECTS: 3; Mo, 15:15 - 16:45, 1.225; Vorbesprechung: 17.4.2007, 11:00 - 12:00 Uhr, 2.65
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Kunze, J.
Schmuki, P.
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Schwerpunktfächer
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VORL; 2 SWS; ECTS: 3; Di, 16:15 - 17:45, 1.225
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PF MAP-S-AP 2
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Wasserscheid, P.
Jess, A.
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VORL; 2 SWS; ECTS: 3; Mi, 17:00 - 18:30, 1.225
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PF MAP-S-AP 2
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Arlt, W.
Wasserscheid, P.
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VORL; 1 SWS; ECTS: 1,5; jede 2. Woche Di, 9:00 - 12:00, 1.225
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PF MAP-S-NM 2
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Forchel, A.
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VORL; 2 SWS; ECTS: 3; Mo, 17:00 - 18:30, Raum n.V.
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PF MAP-S-BMP 2
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Buchholz, R.
Freitag, R.
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PR; 4 SWS; Schein; ECTS: 4; Zeit und Raum n.V.
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Alle Assistenten
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Processing and Funcionality of Organic Electronic Devices [PFOEDevic]
VORL; 1 SWS; ben. Schein; ECTS: 1,5; Fr, 9:15 - 10:00, 1.225
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PF MAP-S-NM ab 2
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Halik, M.
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PJS; 4 SWS; Schein; ECTS: 4; Zeit und Raum n.V.
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Alle Assistenten
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Soft Skills
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V/UE; 4 SWS; Schein; ECTS: 4; Mo, Di, 8:00 - 13:00, MAP PR; Do, 8:00 - 18:00, MAP PR; Termine sind Alternativtermine. Themen und detaillierte Zeitplanung sind in der MAP-Geschäftsstelle zu erfragen.
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PF MAP-S-BMP 2
PF MAP-S-NM 2
PF MAP-S-CMP 2
PF MAP-S-AP 2
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Schlücker, E.
Ebel, N.
Bartels, K.
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