Semiconductor Devices and Applications (S D&A)5 ECTS
(englische Bezeichnung: Semiconductor Devices and Applications)
(Prüfungsordnungsmodul: Semiconductor Devices and Applications)

Lehrveranstaltungen:

• • Advanced Semiconductors Introduction: Devices & Applications (WS 2021/2022)
    (Vorlesung, 2 SWS, Andres Osvet et al., Mo, 18:15 - 19:45, H14; ab 25.10.2021; wenn ZOOM-Meetings, werden Zugansdaten im StudOn angegeben. Vorbesprechung wird in der Vorbesprechung zum Masterstudium am i-MEET durchgeführt, ZOOM am 18.10.21 um 9 Uhr. https://fau.zoom.us/j/66397932198?pwd=TCt5Unlack5BVTFUckpUelBQeDgyUT09 Meeting-ID: 663 9793 2198 Kenncode: 022307; Vorbesprechung: 18.10.2021, 9:00 - 10:00 Uhr)
  • Lab Work Thin Film Semiconductors (SS 2022)
    (Praktikum, 2 SWS, Anwesenheitspflicht, Andres Osvet et al., Zeit n. V., Labore LS i-MEET)

Empfohlene Voraussetzungen:

Bachelor in Material Science, Nanotechnology, Energy Technology, Electronic Engineering, Computer Science, Physics, Chemistry, Chemical Engineering , Nanotechnologie, Energietechnik, Elektrotechnik, Physik, Chemie or comparable

Inhalt:

Lecture / Exercise / Lab work

• Introduction into the fundamentals, materials and application of thin film semiconducting devices

• semiconductor junctions

• display technologies

• photovoltaic technologies

• photodetector and X-Ray technologies

• thin film transistor, memory , storage and energy harvesting technologies
  

Lernziele und Kompetenzen:

• The students will get a detailed introduction and overview on various selected thin film device technologies, with emphasis on display technologies, lighting, energy harvesting and photovoltaics (renewable energies).

• Independent development of a selected AST topic to the level of comprehension that the student can give a 25 min tutorial / presentation, presentation skills and techniques,

• Processing and characterization of thin film semiconductors and semiconducting devices such as photovoltaics, LEDs, light conversion layers (lab course).

• Data handling, data storage and written reporting in material science (lab course)
  

Literatur:

Wird an der Vorlesung dargestellt

Verwendbarkeit des Moduls / Einpassung in den Musterstudienplan:

1. Nanotechnologie (Master of Science)
   (Po-Vers. 2020w | TechFak | Nanotechnologie (Master of Science) | Gesamtkonto | Kernfächer | Materialien der Elektronik und der Energietechnologie | Semiconductor Devices and Applications)
2. Nanotechnologie (Master of Science)
   (Po-Vers. 2020w | TechFak | Nanotechnologie (Master of Science) | Gesamtkonto | 1. und 2. Naturwissenschaftlich-technisches Wahlmodul | Semiconductor Devices and Applications)

Studien-/Prüfungsleistungen:

Semiconductor Devices and Applications (Prüfungsnummer: 62521)

(englischer Titel: Semiconductor Devices and Applications)

Prüfungsleistung, mehrteilige Prüfung, Dauer (in Minuten): 15, benotet, 5 ECTS

Anteil an der Berechnung der Modulnote: 100.0 %

weitere Erläuterungen:
Lecture - graded certificate (students choose either exam on processsing and characterization of a thin film device or a written report of 10 to 20 pages including a final discussion on the results or a presentation of an independent topic in a seminar). Lab Work (1 practical with final report of approximately 1- - 15 pages)

Prüfungssprache: Englisch

Erstablegung: SS 2022, 1. Wdh.: WS 2022/2023

1. Prüfer:

Christoph J. Brabec