Advanced Semiconductor Technologies - Characterization and Advanced Defect Imaging of PV Modules and Systems (AST-DefIm-PR)- Lecturers
- Prof. Dr. Christoph J. Brabec, Dr. Jens Hauch
- Details
- Praktikum
1 cred.h, ECTS studies, ECTS credits: 1, Sprache Englisch
Time and place: n.V.
- Fields of study
- WF MWT-MA-WET ab 1 (ECTS-Credits: 1)
WF NT-MA-WET ab 1 (ECTS-Credits: 1)
WF ET-MA-MWT ab 1 (ECTS-Credits: 1)
- ECTS information:
- Credits: 1
- Additional information
- Expected participants: 15, Maximale Teilnehmerzahl: 20
- Department: Chair of Materials for Electronics and Energy Technology
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