Forschungsschwerpunkte The Institute of General Materials Properties is specialized in research related to micro-structure-based aspects of materials properties with particular emphasis on mechanical behaviour under complex loading conditions and on high-temperature solid-state reactions. The major areas of research are devoted to
Crystal Plasticity and Hardening Mechanisms
High-Temperature Deformation
Fatigue of Materials
Internal and Residual Stresses
Modelling (analytical, numerical, finite elements)
Protective Coatings
Materials Problems in Components
Failure Analysis
Forschungsrelevante apparative AusstattungMetallography, Microscopy and Analysis:
2 Transmission electron microscopes (Philips EM 400T and Philips CM 200) with STEM and EDS, Tietz high-resolution CCD-camera on Philips CM 200
Scanning electron microscope, Jeol 6400 JSM with BSE, EBSP and EDS
Optical microscope Leica DM-RM with digital camera ProgRes 3008 and image analy-sis system Image C
Other different optical microscopes
2 X-ray diffractometers
X-ray Laue camera
X-ray topography apparatus
Secondary ion mass spectrometer
Scanning Auger microscope Perkin Elmer PHI 670 Xi with XPS (share, charge for use)
Metallography and photographic laboratory
2 Ion mills Balzers RES 010
Mechanical testing:
2 Servohydraulic mechanical testing systems with high temperature equipment
Servohydraulic mechanical testing system with heating/cooling/vacuum chamber
Vibrophore system with vacuum chamber
3 Electromechanical mechanical testing systems with high temperature equipment
4 Compressive creep machines for tests at constant stress
4 Tensile creep machines for tests at constant stress
8 Tensile creep machines for tests at constant load
Others:
Elastomat for measurement of dynamic elastic constants
2 Dilatometers
UNIX and PC-network, Windows
Mechanical Workshop
Central mechanical and electronic workshop (share, charge for material costs)
VeröffentlichungsreihenDie Veröffentlichungen des Jahres 2000 finden Sie als pdf-File unter:
http://131.188.233.11/scripte/veroeff00.pdf
Die Veröffentlichungen des Jahres 2001 finden Sie als pdf-File unter:
http://131.188.233.11/scripte/veroeff01.pdf Die Veröffentlichungen der letzten Jahre unter:
http://131.188.233.11/literatur.html#2000
| Leitung Prof. Dr. rer. nat. Mathias Göken PD Dr.-Ing. Heinz Werner Höppel
Professoren Prof. Dr.-Ing. Erik Bitzek Prof. Dr. Peter Felfer Prof. Dr. rer. nat. Mathias Göken
Professoren i.R. Prof. Dr.-Ing. Wolfgang Blum Prof. Dr. Dr.-Ing. E.h. Hael Mughrabi
Akad. Räte PD Dr.-Ing. Heinz Werner Höppel Dr.-Ing. Duancheng Ma Dr.-Ing. Steffen Neumeier
Wiss. Assistenten Dr. Valentin Dalbauer Dr.-Ing. Dorothea Matschkal PD Dr.-Ing. Benoit Merle
Wiss. Mitarbeiter Achraf Atila, M. Sc. Andreas Bezold Benedikt Diepold, M. Sc. Benedikt Eggle-Sievers, M.Sc. Daniel Elitzer, M. Sc. Andreas Förner, M. Sc. Stefan Gabel, M.Sc. Philip Goik, M. Sc. Daniel Hausmann Lukas Haussmann, M. Sc. Martina Heller Frédéric Houllé Fabian Hummel, M. Sc. Jan Josten, M. Sc. Dr. Shivraj Karewar Saba Khadivianazar Andreas Kirchmayer, M. Sc. Manuel Köbrich, M. Sc. Marius Kohlhepp, M. Sc. Anna Krapf Sebastian Krauß, M. Sc. Moritz Kuglstatter, M. Sc. PhD Chandra Macauley Benedict Ott, M. Sc. Nina Pfeffer, M. Sc. Philip Pohl, M. Sc. Lakshmipathy Tarakeshwar Yvonne Thompson, M. Sc. Nicklas Volz, M. Sc.
Stipendiaten Maher Ghanem, M. Sc.
|