Produktanalyse (PCHAR)
- Dozentinnen/Dozenten
- Dr.-Ing. Johannes Walter, Prof. Dr.-Ing. Wolfgang Peukert
- Angaben
- Vorlesung
2 SWS, ECTS-Studium, ECTS-Credits: 4
nur Fachstudium, Sprache Englisch
Zeit und Ort: Mo 14:15 - 15:45, LSTM-SR; Di 12:15 - 13:45, LSTM-SR; Bemerkung zu Zeit und Ort: Sign into the StudOn course Produktanalyse for further information about lectures/exercises and related modalities. https://www.studon.fau.de/studon/goto.php?target=crs_4039568
- Studienfächer / Studienrichtungen
- WPF CBI-MA 1-3
WPF NT-MA 3
WPF ET-MA-VTE 3
WPF CEN-MA 1-3
- Inhalt
- The lecture introduces modern (optical) techniques for characterization of disperse systems in chemical engineering and materials science. The participants will learn general principles as well as where, when and on which time scale information on materials properties can be gained by the discussed methods. For disperse systems the latter can be for example particle size, particle shape, materials composition, electronic properties and surface chemistry as well as surface charge. The participants will learn in the lecture how to judge the results of an individual technique, learn about its boundaries and where a combination of several techniques is more promising. As many of the optical techniques rely on good knowledge in optics and their fundaments, the necessary skills will be briefly introduced.
Introduction to Materials Properties and Classification
Sampling, Error Sources and their Analysis- Definition and Determination of Particle Distribution, Size and Shape
Principles Optics and Diffraction I
Principles Optics and Diffraction II
Diffraction, Rayleigh-, Mie scattering
Static and Dynamic Light scattering
X-Ray Scattering and Applications
Zetapotential and its measurement with optical methods
Analytical Ultra-Centrifugation with Multi-Wavelength Optics
Nonlinear Optics at Interfaces and its Application
Color and its Measurement: UV-Vis and Fluorescence Spectroscopy
Infrared and Raman Spectroscopy including Surface-Enhanced Techniques
Scanning Mobility Particle Sizer (SMPS)
Scanning Probe Microscopy and Electron Microscopy
- Empfohlene Literatur
- Principles of physics extended (9. ed., internat. student version); Authors: David Halliday, Robert Resnik, Jearl Walker; Wiley 2011
Springer Handbook of Materials Measurement Methods; Authors: Horst Czichos, T. Saito, Smith Leslie; Springer 2006 (electronic access within FAU)
Nonlinear Optics; Author: Robert W. Boyd; Academic Press 2008
- ECTS-Informationen:
- Credits: 4
- Zusätzliche Informationen
- Schlagwörter: Produktanalyse
Erwartete Teilnehmerzahl: 15
- Zugeordnete Lehrveranstaltungen
- UE: Übung Produktanalyse
-
Dozentinnen/Dozenten: Dr.-Ing. Johannes Walter, Prof. Dr.-Ing. Wolfgang Peukert
Zeit und Ort: n.V.; Bemerkung zu Zeit und Ort: s. Aushang (Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik, Cauerstraße 4)
- Verwendung in folgenden UnivIS-Modulen
- Startsemester WS 2021/2022:
- Produktanalyse (PCHAR)
- Institution: Chair of Particle Technology (Prof. Dr. Peukert)
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