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Scanning Probe Microscopy

Lecturer
Prof. Dr. Sabine Maier

Details
Vorlesung
, ECTS studies, ECTS credits: 5, Sprache Deutsch oder Englisch
Time and place: Wed 12:00 - 14:00, SR 00.103; Wed, room tbd; comments on time and place: verschiebbar

Fields of study
WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1

Contents
Introduction in scanning probe microscopy techniques

  • Scanning tunneling microscopy (STM)

  • Atomic force microscopy (AFM)

  • Kelvin probe force microscopy (KPFM)

  • Conductive atomic force microscopy (cAFM)

  • Scanning Near-field microscopy (SNOM)

Applications

  • Atomic manipulation

  • Nanoelectronics

  • Nanomagnetism and spin-mapping

  • Nanomechanics

  • Surface reactions

Recommended literature
General literature on scanning probe microscopy:
1. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
2. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.

ECTS information:
Credits: 5

Additional information

Assigned lectures
UE: Scanning Probe Microscopy (excercise class)
Lecturer: Prof. Dr. Sabine Maier
Time and place: Wed 14:00 - 15:00, SR 01.332; comments on time and place: verschiebbar

Verwendung in folgenden UnivIS-Modulen
Startsemester SS 2015:
Physikalisches Wahlfach: Scanning Probe Microscopy (PW)

Department: Juniorprofessur für Experimentalphysik (Rastersondenmikroskopie) (Prof. Dr. Maier)
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