AG Nanophysics using Scanning Probe Microscopy

Lecturer:

Sabine Maier

Details:

Arbeitsgemeinschaft, 2 cred.h

Dates:

Mon, 12:00 - 14:00, room tbd

Nanophysics using Scaning Probe Microscopy

Lecturer:

Sabine Maier

Details:

Vorlesung, 2 cred.h, ECTS: 5

Dates:

Tue, 14:15 - 16:00, SR 01.779
Preliminary meeting: Tuesday, 19.10.2021, 14:00 - 16:00 Uhr, TL 1.140

Fields of study:

WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
WF LaP-SE ab 5

Contents:

1. Introduction in various scanning probe microscopy techniques

• Scanning tunneling microscopy (STM)

• Atomic force microscopy (AFM)

• Kelvin probe force microscopy (KPFM)

• Conductive atomic force microscopy (cAFM)

• Scanning Near-field microscopy (SNOM)

2. Complementary surface-science techniques

• X-Ray photoelectron spectroscopy (XPS)

• Low energy electron diffraction (LEED)

3. Introduction to nanophysics

• Atomic manipulation

• Nanoelectronics

• Nanomagnetism and spin-mapping

• Nanomechanics

• Self-assembly and surface reactions

Recommended literature:

1. B. Voigtländer, Scanning Probe Micorsocpy, Springer 2015
2. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
3. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.

Nanophysics using Scaning Probe Microscopy - Exercises

Lecturer:

Sabine Maier

Details:

Übung

Dates:

Tue, 16:00 - 17:00, SR 01.779
The time for the exercises can be changed and will be discussed in the first meeting

Fields of study:

WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA 1

Rastersondenmikroskopie

Lecturer:

Sabine Maier

Details:

Seminar, 2 cred.h

Dates:

time tbd, Zoom-Meeting
Rastersondenmikroskopie