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Seminar: Reliability Analysis in Embedded Systems (RA-SEM)- Lecturers
- Dr.-Ing. Hananeh Aliee, Faramarz Khosravi, M. Sc., Dr.-Ing. habil. Daniel Ziener
- Details
- Seminar
, benoteter certificate, ECTS studies, ECTS credits: 5,0, Sprache Englisch
Time and place: single appointment on 6.11.2017 16:00 - 18:00, 02.142-128; single appointment on 8.12.2017 13:00 - 15:00, 02.133-128; single appointment on 23.2.2018 13:00 - 17:00, 02.112-128; comments on time and place: n.V., Initial session will be in the 2nd week of the semester. Further details will be sent in an email to the registered participants.
- Fields of study
- WPF I2F-BA ab 4
WF IuK-MA ab 1
WF IuK-BA ab 4
WPF CE-MA-SEM ab 1
WPF INF-MA ab 1
- ECTS information:
- Credits: 5,0
- Additional information
- www: https://www.cs12.tf.fau.de/lehre/lehrveranstaltungen/seminare/reliability-analysis-in-embedded-systems/
- Verwendung in folgenden UnivIS-Modulen
- Startsemester WS 2017/2018:
- Seminar: Reliability Analysis in Embedded Systems (RA-SEM)
- Department: Chair of Computer Science 12 (Hardware-Software-Co-Design)
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