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Seminar: Reliability Analysis in Embedded Systems (RA-SEM)
- Lecturers
- Dr.-Ing. Hananeh Aliee, Faramarz Khosravi, M. Sc., Prof. Dr.-Ing. Jürgen Teich
- Details
- Seminar
, benoteter certificate, ECTS studies, ECTS credits: 5,0, Sprache Englisch
Time and place: n.V.; comments on time and place: n.V.
- Fields of study
- WPF I2F-BA-S 5
WPF I2F-BA ab 4
WF IuK-MA ab 1
WF IuK-BA ab 4
WPF CE-MA-SEM ab 1
WPF INF-MA ab 1
- ECTS information:
- Credits: 5,0
- Additional information
- www: http://www12.informatik.uni-erlangen.de/edu/reliability_sem
- Verwendung in folgenden UnivIS-Modulen
- Startsemester SS 2017:
- Seminar: Reliability Analysis in Embedded Systems (RA-SEM)
- Department: Chair of Computer Science 12 (Hardware-Software-Co-Design)
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