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Scanning Probe Microscopy- Lecturer
- Prof. Dr. Sabine Maier
- Details
- Vorlesung
, ECTS studies, ECTS credits: 5, Sprache Deutsch oder Englisch
Time and place: Wed 12:00 - 14:00, SR 00.103; Wed, room tbd; comments on time and place: verschiebbar
- Fields of study
- WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
- Contents
- Introduction in scanning probe microscopy techniques
Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Kelvin probe force microscopy (KPFM) Conductive atomic force microscopy (cAFM) Scanning Near-field microscopy (SNOM)
Applications
- Recommended literature
- General literature on scanning probe microscopy:
1. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
2. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.
- ECTS information:
- Credits: 5
- Additional information
- Assigned lectures
- UE: Scanning Probe Microscopy (excercise class)
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Lecturer: Prof. Dr. Sabine Maier
Time and place: Wed 14:00 - 15:00, SR 01.332; comments on time and place: verschiebbar
- Verwendung in folgenden UnivIS-Modulen
- Startsemester SS 2015:
- Physikalisches Wahlfach: Scanning Probe Microscopy (PW)
- Department: Juniorprofessur für Experimentalphysik (Rastersondenmikroskopie) (Prof. Dr. Maier)
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