|
|
Nanophysics using Scaning Probe Microscopy- Lecturer
- Prof. Dr. Sabine Maier
- Details
- Vorlesung
, ECTS studies, ECTS credits: 5, Sprache Englisch
Time and place: Wed 12:00 - 14:00, SR 01.332
- Fields of study
- WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
- Contents
- 1. Introduction in various scanning probe microscopy techniques:
Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Kelvin probe force microscopy (KPFM) Conductive atomic force microscopy (cAFM) Scanning Near-field microscopy (SNOM)
2. Introduction to Nanophyics based on scanning probe experiments:
- Recommended literature
- 1. B. Voigtländer, Scanning Probe Micorsocpy, Springer 2015
2. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
3. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.
- ECTS information:
- Credits: 5
- Additional information
- Assigned lectures
- VORL: Nanophysics using Scaning Probe Microscopy - Exercises
-
Lecturer: Prof. Dr. Sabine Maier
Time and place: Wed 14:00 - 15:00, SR 01.332
- Verwendung in folgenden UnivIS-Modulen
- Startsemester WS 2017/2018:
- Nanophysics using Scaning Probe Microscopy (PW)
- Department: Professur für Experimentalphysik (Rastersondenmikroskopie) (Prof. Dr. Maier)
|
|
|